Reliability Verification, Testing, and Analysis in Engineering DesignCRC Press, 2002. gada 27. nov. - 416 lappuses Striking a balance between the use of computer-aided engineering practices and classical life testing, this reference expounds on current theory and methods for designing reliability tests and analyzing resultant data through various examples using Microsoft® Excel, MINITAB, WinSMITH, and ReliaSoft software across multiple industries. The book disc |
No grāmatas satura
6.10. rezultāts no 34.
11. lappuse
... lead to infant mortalities and other field - related issues . Process deficiency : Examples include inadequate heat - treating , metal forming , or cutting , which leads to the buildup of residual stresses in notched or formed areas ...
... lead to infant mortalities and other field - related issues . Process deficiency : Examples include inadequate heat - treating , metal forming , or cutting , which leads to the buildup of residual stresses in notched or formed areas ...
16. lappuse
... lead to improved product reliability . The use of Eq . ( 1.3 ) is discussed in greater detail in Chapter 2 . Success - Failure Testing In design verification testing , items are placed on test for a predetermined duration . The numbers ...
... lead to improved product reliability . The use of Eq . ( 1.3 ) is discussed in greater detail in Chapter 2 . Success - Failure Testing In design verification testing , items are placed on test for a predetermined duration . The numbers ...
17. lappuse
... lead to a sudden failure . Strengths vary due to manufacturing and product usage and therefore also possess a distribution . Accordingly , both stress and strength possess distributions , a conceptual model of which is presented in ...
... lead to a sudden failure . Strengths vary due to manufacturing and product usage and therefore also possess a distribution . Accordingly , both stress and strength possess distributions , a conceptual model of which is presented in ...
18. lappuse
... lead to a failure event . In this case the engineer seeks to understand the effect of stresses such as temperature , loading , etc. on product life using models founded upon physics . The models may also be empirical based on scientific ...
... lead to a failure event . In this case the engineer seeks to understand the effect of stresses such as temperature , loading , etc. on product life using models founded upon physics . The models may also be empirical based on scientific ...
21. lappuse
... lead to a catastrophic failure event . For such situations , the engineer must set up an artificial limit , the test bogey limit , beyond which a bogey failure is said to have occurred . Its usage is illustrated by Figure 1-4 . The ...
... lead to a catastrophic failure event . For such situations , the engineer must set up an artificial limit , the test bogey limit , beyond which a bogey failure is said to have occurred . Its usage is illustrated by Figure 1-4 . The ...
Saturs
LXXXVII | 204 |
LXXXVIII | 206 |
XC | 207 |
XCII | 208 |
XCIV | 210 |
XCVI | 211 |
XCVII | 213 |
XCVIII | 214 |
XI | 23 |
XII | 24 |
XIII | 25 |
XIV | 29 |
XV | 30 |
XVI | 32 |
XVIII | 35 |
XIX | 36 |
XX | 40 |
XXI | 63 |
XXII | 64 |
XXIV | 68 |
XXV | 71 |
XXVI | 74 |
XXVII | 75 |
XXVIII | 77 |
XXIX | 79 |
XXX | 81 |
XXXI | 83 |
XXXII | 84 |
XXXIII | 86 |
XXXIV | 88 |
XXXVI | 90 |
XXXVII | 92 |
XXXVIII | 95 |
XXXIX | 101 |
XLI | 104 |
XLIII | 105 |
XLIV | 110 |
XLV | 114 |
XLVI | 117 |
XLVIII | 118 |
L | 119 |
LI | 121 |
LII | 125 |
LIII | 126 |
LVI | 127 |
LVII | 129 |
LVIII | 131 |
LIX | 133 |
LX | 135 |
LXI | 137 |
LXIII | 142 |
LXIV | 147 |
LXV | 148 |
LXVI | 151 |
LXVII | 155 |
LXVIII | 157 |
LXIX | 159 |
LXX | 161 |
LXXI | 162 |
LXXII | 163 |
LXXIII | 164 |
LXXIV | 166 |
LXXV | 168 |
LXXVI | 173 |
LXXVII | 177 |
LXXVIII | 180 |
LXXIX | 186 |
LXXX | 189 |
LXXXI | 190 |
LXXXII | 195 |
LXXXIII | 196 |
LXXXIV | 199 |
LXXXV | 201 |
LXXXVI | 203 |
XCIX | 216 |
CI | 217 |
CII | 221 |
CIII | 222 |
CIV | 224 |
CVI | 225 |
CVIII | 226 |
CIX | 229 |
CX | 231 |
CXI | 233 |
CXII | 234 |
CXIII | 238 |
CXIV | 239 |
CXV | 240 |
CXVI | 241 |
CXVII | 246 |
CXVIII | 250 |
CXIX | 253 |
CXX | 254 |
CXXI | 255 |
CXXII | 257 |
CXXIII | 259 |
CXXIV | 260 |
CXXV | 265 |
CXXVII | 271 |
CXXVIII | 274 |
CXXX | 277 |
CXXXI | 280 |
CXXXII | 282 |
CXXXIV | 284 |
CXXXV | 287 |
CXXXVI | 289 |
CXXXVII | 290 |
CXXXVIII | 291 |
CXXXIX | 292 |
CXLI | 300 |
CXLIII | 305 |
CXLV | 307 |
CXLVI | 309 |
CXLVIII | 311 |
CXLIX | 312 |
CL | 314 |
CLI | 316 |
CLII | 319 |
CLIII | 320 |
CLIV | 322 |
CLVI | 325 |
CLVII | 329 |
CLVIII | 351 |
CLIX | 352 |
CLXI | 356 |
CLXIII | 359 |
CLXV | 360 |
CLXVI | 362 |
CLXVII | 367 |
CLXVIII | 368 |
CLXIX | 369 |
CLXX | 371 |
CLXXII | 372 |
CLXXIII | 373 |
CLXXIV | 376 |
CLXXVI | 377 |
CLXXVII | 379 |
CLXXVIII | 387 |
Citi izdevumi - Skatīt visu
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Ierobežota priekšskatīšana - 2002 |
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Priekšskatījums nav pieejams - 2002 |
Bieži izmantoti vārdi un frāzes
accelerated analysis Appendix approximation asymptotic beta distribution binomial distribution bogey testing Chapter component computer-aided engineering confidence intervals confidence limit cumulative cycles density function design verification electronics Equation evaluated exponential distribution expression F-distribution failure distribution failure mode Figure FMEA Goal Seek hazard identify illustrated inverse likelihood contours likelihood estimation linear location-scale distribution lognormal distribution lower confidence limit LR limits maximum likelihood median rank Microsoft Excel Minitab ML estimates Monte Carlo MTTF normal distribution occur parameter estimates percentile phenomena potential failure modes probability plots procedure properties Q-Q plots random variable rank estimator rank regression recorded failures relationship reliability metrics right-censored sample sizes shape parameter simulation standard normal stress subsystem success-failure test t₁ Table temperature usage values variance wearout Weibayes Weibull data Weibull distribution Weibull parameters Weibull plot Worked-out Example