 | Electrochemical Society. Meeting - 2003 - 538 lapas
...Ernst, D. Munteanu, and T. Ouisse, Int. J. of High Speed Electron. and Syst. 1 0, 2 1 7 (2000). 3. DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur, and H.-SP Wong, Proc. IEEE 89, 259 (2001). 4. Y. Naveh and K. Likharev, IEEE Electron. Dev. Lett. 21, 242 (2000). 5.... | |
 | Christian Piguet - 2018 - 912 lapas
...TH Ning, Fundamentals of Modern VLSI Devices, Cambridge University Press, Cambridge, UK, 1998. [12] DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur,...of Si MOSFETs and their application dependencies, Proc. IEEE, 89, 259-288, 2001. [13] B. Doyle, B. Boyanov, S. Datta, M. Doczy, S. Hareland, B. Jin,... | |
 | Siva G. Narendra, Anantha P. Chandrakasan - 2006 - 308 lapas
...Wann, SJ Wind, HonSum Wong: CMOS Scaling into the Nanometer Regime. Proceedings of IEEE 85 486 (1997) DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur...of Si MOSFETs and Their Application Dependencies. Proceedings of IEEE 89, 259 (2001) D. Hisamoto, Wen-Chin Lee, J. Kedzierski, H. Takeuchi, K. Asano,... | |
 | Howard Huff - 2005 - 740 lapas
...Structure at the atomic scale of ultra-thin gate oxides, Nature 399, pp. 758761 (June 24, 1999) 21.4. DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur...Si MOSFETs and their application dependencies, Proceedings of the IEEE 89, p. 259 (2001) 21.5. R. Chau et al., A 5Onm Depleted-Substrate CMOS Transistor... | |
 | John D. Cressler - 2018 - 1248 lapas
...BiCMOS technology. Technical Digest of the Electron Devices Meeting, San Francisco, 1992, pp. 19-22. 22. DJ Frank, RH Dennard, E Nowak, PM Solomon, Y Taur,...of Si MOSFETs and their application dependencies. Proc IEEE 89(3):259-288, 2001. 23. K Rim, S Koester, M Hargrove, J Chu, PM Mooney, J Ott, T Kanarsky,... | |
 | Siva G. Narendra, Anantha P. Chandrakasan - 2006 - 308 lapas
...Wann, SJ Wind, HonSum Wong: CMOS Scaling into the Nanometer Regime. Proceedings of IEEE 85 486 (1997) DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur...of Si MOSFETs and Their Application Dependencies. Proceedings of IEEE 89, 259 (2001) D. Hisamoto, Wen-Chin Lee, J. Kedzierski, H. Takeuchi, K. Asano,... | |
 | John D. Cressler - 2018 - 264 lapas
...BiCMOS technology. Technical Digest of the Electron Devices Meeting, San Francisco, 1992, pp. 19-22. 22. DJ Frank, RH Dennard, E Nowak, PM Solomon, Y Taur,...of Si MOSFETs and their application dependencies. Proc IEEE 89(3):259-288, 2001. 23. K Rim, S Koester, M Hargrove, J Chu, PM Mooney, J Ott, T Kanarsky,... | |
 | Sorin Alexander Huss - 2007 - 358 lapas
...funded by the French Ministry of Research under Nanosys ("Programme ACI Nanosciences"). References [1] DJ. Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur,...of Si MOSFETs and their application dependencies. Proc. of IEEE, 89(3):259-288, 2001. [2] International technology roadmap for semiconductors 2004 update.... | |
 | S. Hall, A.N. Nazarov, V.S. Lysenko - 2007 - 377 lapas
...oxide, IEEE Transactions on Electron Devices 45(3), 691-700 (1998). 28. Frank, R. Dennard, E. Nowak, P. Solomon, Y. Taur, and H.-SP Wong, Device scaling limits...of Si MOSFETs and their application dependencies, Proceedings of the IEEE 89, 259-288 (2001). 29. Frank, Y. Taur, and H.-S. Wong, Generalized scale length... | |
 | Sergey Edward Lyshevski - 2018 - 912 lapas
...Proc. Asia & South Pacific Design Autom. Conf. ASP-DAC'00, Tokyo, Japan, Jan. 2000, pp. 553-558. [8] DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur, and H.-SP Wong, "Device scalinglimits of Si MOSFETs and their application dependencies," Proc. IEEE, vol. 89, Mar. 2001, pp.... | |
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DJ Frank, RH Dennard, E. Nowak, PM Solomon, Y. Taur, and HSP Wong, Device scaling limits of Si MOSFETs and their application dependencies, Proc. 