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" Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation," in Proceedings of International Symposium on Low Power Electronics and Design, 2003, pp. "
Design for Manufacturability and Statistical Design: A Constructive Approach - 302. lappuse
autors: Michael Orshansky, Sani Nassif, Duane Boning - 2007 - 316 lapas
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Multi-Threshold CMOS Digital Circuits: Managing Leakage Power

Mohab Anis, Mohamed I. Elmasry - 2003 - 248 lapas
...in Proc. IEEE International Symposium on Low Power Electronics and Design, August 2003. (To appear) S. Mukhopadhyay and K. Roy, "Modeling and Estimation...Considering the Effect of Parameter Variation," in Proc. IEEE International Symposium on Low Power Electronics and Design, August 2003. (To appear) Body...
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Low-Power High-Level Synthesis for Nanoscale CMOS Circuits

Saraju P. Mohanty, Nagarajan Ranganathan, Elias Kougianos, Priyardarsan Patra - 2008 - 325 lapas
...International Conference on Computer Design (ICCD), pp. 441^143 (2005) 241. Mukhopadhay, S., Roy, K.: Modeling and estimation of total leakage current in...effect of parameter variation. In: Proceedings of the IEEE International Symposium on Low Power Design, pp. 172—175 (2003) 242. Mukhopadhyay, S., Raychowdhury,...
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