Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation," in Proceedings of International Symposium on Low Power Electronics and Design, 2003, pp. Design for Manufacturability and Statistical Design: A Constructive Approach - 302. lappuse autors: Michael Orshansky, Sani Nassif, Duane Boning - 2007 - 316 lapas Ierobežota priekšskatīšana -
|