Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 47.
... . . . . . . . . . . . . . . . . . 24 2.3 GATE WIDTH VARIABILITY . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 2.4 THRESHOLD VOLTAGE VARIABILITY . . . . . . . . . . . . . . . . . . 27 2.5 THIN FILM THICKNESS ...
... widths and spacings for the various layers that composed the integrated circuit. The role of the models was to enable us to predict the behavior of the integrated circuit given that it is not possible to prototype the IC in order to ...
... width) of a device can be set are limited by the residual error that remains after RET is applied. At the 65nm node and below, assuming the lithography roadmap remains as it is currently defined, the radius of influence that defines the ...
... width combinations previously used. We can still get a lot of information from these devices, but since they differ from the devices that will actually be used in the real circuit, it is not clear that the information will be helpful ...
... width of the channel, will become quite noticeable for devices below 50nm, and will be severe at 32nm, also contributing to the overall variability of gate length [12]. The second distinction is based on the spatial scale in which ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |