Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.5. rezultāts no 92.
... variation can be attributed to several factors. The first is the rise of multiple systematic sources of parameter variability caused by the interaction between the manufacturing process and the design attributes. For example, optical ...
... variation, eventually leading to variation in circuit-level performances, such as delay and power. This book presents an overview of the methods that need to be mastered in understanding state-of-the-art Design for Manufacturability ...
... VARIATIONS DUE TO AGING AND WEAROUT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 2.9 SUMMARY ... VARIATION . . . 50 3.5.
... Sani Nassif, Duane Boning. 3.4 MULTILEVEL COPPER INTERCONNECT VARIATION . . . 50 3.5 INTERCONNECT LITHOGRAPHY AND ETCH VARIATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 3.6 DIELECTRIC ...
... variation in the channel length of MOSFET devices is related to the orientation of the devices. With a suitable quantitative model relating the variation to design practice, a designer can fully take this effect into account during the ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |