Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 65.
... typical for a handful of practitioners working on a particular design to have a fairly complete understanding of the ... typically determined the minimum widths and spacings for the various layers that composed the integrated circuit ...
... typical device from which to perform device model characterization. We will come back to this subject later in Chapter 5. Secondly, it will make the circuit extraction phase of design verification (where the layout is converted into a ...
... typical GHz design. Whether physical or environmental, we can classify components of variability in various ways ... typically cause large increases in design cost. A key point to remember, however, is that the difference between the ...
... typical dependence of printed linewidth on the pitch is shown on Figure 2.3. Line shortening refers to the reduction in the length of a rectangular feature. This effect is due to factors that include diffraction, the rounding of the ...
... typical dependence of linewidth on the proximity to the neighboring polysilicon lines. (Reprinted from [136], c2001 SPIE). Fig. 2.4. Line shortening. (Reprinted from [136], c2001 SPIE). Fig. 18 2 FRONT END VARIABILITY.
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |