Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 50.
... transistor will soon contain a small countable number of dopant atoms. Because the placement of these dopant atoms is random, the final number of atoms that end up in the channel of each transistor is a random variable. Thus, the ...
... . . 85 5.2 CHARACTERIZATION USING SHORT LOOP FLOWS . . . . 87 5.3 TRANSISTOR TEST STRUCTURES . . . . . . . . . . . . . . . . . . . . . 92 5.4 DIGITAL TEST STRUCTURES . . . . . . . . . . . . . . . . . . . . . . . . . . 94 5.5 SUMMARY ...
... transistor. We do not mean to imply that the scaling of these dimensions did not make transistor modeling more difficult, but rather to point out that the behavior of the transistor was determined by local geometry and that its ...
... transistor channel length on the device' orientation in the layout is completely systematic and predictable in that ... transistor level adaptivity where the transistor switching speed and leakage power consumption are controlled by ...
... transistor. The method has been shown to be effective in drastically improving both chip speed and its parametric yield [4]. Another example is the temporal redundancy scheme that allows lower average energy consumption largely without ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |