Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 84.
... techniques. This interest is directly attributed to the difficulties of manufacturing of integrated circuits in nanometer scale CMOS technologies with high functional and parametric yield. The scaling of CMOS technologies brought about ...
... techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical ... Techniques for Systematic Manufacturability Problems, and deals with techniques of design VIII Preface.
... techniques of design for manufacturability. Chapter 7 describes the interaction of the design and the lithographic flow, and methods for improving printability. Chapter 8 is devoted to a description of techniques for metal fill required ...
... . . . . . . . . . . . . . . . . . . . . . . 119 6.7 SUMMARY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122 Problems 7 LITHOGRAPHY ENHANCEMENT TECHNIQUES . . . . . XII Contents.
... TECHNIQUES . . . . . . 127 7.1 FUNDAMENTALS OF LITHOGRAPHY . . . . . . . . . . . . . . . . . . 128 7.1.1 Optical Resolution Limit . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 7.2 PROCESS WINDOW ANALYSIS ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |