Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 30.
... stochastic) mathematical models. For example, despite the seeming randomness of data, it can be 1.5 DESIGN FOR MANUFACTURABILITY VS. STATISTICAL DESIGN 7 shown (as 6 1 INTRODUCTION MODEL TO HARDWARE MATCHING DESIGN FOR MANUFACTURABILITY ...
... stochastic models of the behavior can be supplied. Such models describe the behavior of a parameter using the means of probability theory and statistics. The parameter is treated as a random variable and the modeling goal is to describe ...
... stochastic models. Here we briefly discuss these taxonomies. The entire semiconductor flow is often partitioned into its front-end and back-end components. The front-end cluster comprises manufacturing steps that are involved in ...
... stochastic process, and trying to geometrically define materials at the dimensional scale that is comparable to atomic structure of the materials. In other words, the key dimensions of MOS transistor approach the scale of the silicon ...
... stochastic (random, statistical) variability and the systematic (deterministic) types of variability mechanisms. The confusion stems from not distinguishing the ac- tual mechanism by which variation is generated from one's ability to ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |