Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.5. rezultāts no 83.
... reduces the nominal values of key process parameters, such as effective channel length, our ability to correspondingly improve manufacturing tolerances, such as mask fabrication errors and mask overlay control, is limited. This results ...
... reducing design cost and/or improving design performance. With increasing manufacturing process complexity, more and more phenomena are competing for limited modeling resources. This trend, unchecked, endangers our industry's ability to ...
... reduce leakage power consumption by almost 25% according to one experiment [1]. The benefits can also be in terms of ... reduced by up to 64% with only a 3% decrease in performance [3]. The key question that is often raised with regards ...
... [86]. While the exact decomposition of delay variability is design-specific, the device-caused variability is likely to remain the dominant source of path delay variation, because circuit design practices universally used to reduce the.
... reduce the delay of long interconnect lines also help in reducing delay variability due to global interconnect. It is ... reduced, our ability to improve the manufacturing tolerances, such as mask fabrication and overlay control, is ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
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Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |