Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.5. rezultāts no 86.
... functional and parametric yield. The scaling of CMOS technologies brought about the increasing magnitude of variability of key parameters affecting the performance of integrated circuits. The large variation can be attributed to several ...
... functional and meet their performance requirements - was economically viable. The relationship between yield and design rules existed because the yield loss mechanism in those manufacturing processes was dominated by topology changes ...
... function of time but at the same time-scale as that of the operation of the circuit, e.g. in the nano-second range for a typical GHz design. Whether physical or environmental, we can classify components of variability in various ways ...
... the compensation techniques are used to guarantee correct timing and functional behavior. One example is the transistor level adaptivity where the transistor switching speed and leakage power consumption are controlled by adjusting.
... function of Lgate. Because of this exponential dependence, variation of Lgate is greatly amplified in its impact on leakage. The growth of power consumption has led to a situation in which many chips are power-limited. As a result ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
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Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |