Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 43.
... frequency. For example, speed testing needs to be done to measure maximum frequency for each product. The cost of extra testing may be justified by the overall improvement of power consumption or area. The second solution is to use ...
... frequency). It may allow relaxing the fixed yield budget relying instead on a flexible approach in which the optimal design is constructed by combining solutions across the design hierarchy. Design solutions and fixes at the various ...
... frequency bins which are the most profit-generating bins, Lgate variability is economically very costly. It has been estimated by one major semiconductor company that a reduction of 1nm of the standard deviation (σ) of Lgate would ...
... frequency components of the reticle features. Such distortion results in several major types of distortions: linewidth variation (proximity effect), corner rounding, and line-end shortening [22]. These are all systematic behaviors ...
... frequency) and high-frequency types of variation [12]. For this reason, measurements show that there is strong dependence of edge variance on polysilicon gate width. Once the gate width is greater than ∼0.3 um, the variance does not ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |