Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 35.
... 2.2.3 Impact of Etch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 2.2.4 Line Edge Roughness . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 2.2.5 Models of Lgate Spatial Correlation ...
... ETCH VARIATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 3.6 DIELECTRIC VARIATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 3.7 BARRIER METAL DEPOSITION ...
... etching, chemical-mechanical polishing, etc. Both front-end and back-end flows ex- hibit significant variability. In this chapter we concentrate on the front-end variability. It is difficult to say, in a general way, which group of ...
... etch. The increase of intra-chip parameter variation is caused by the emergence of a number of variation-generating mechanisms located on the interface between the design and process. For example, one of the major contributors to the ...
... . Those include the mask, the exposure system, etching, the spacer definition, and implantation of source and drain regions. Factors that contribute to the variability of the polysilicon gate width are. 2.2 VARIABILITY OF GATE LENGTH 15.
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |