Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 61.
... behavior of silicon structures. For example, the shrinking volume of silicon that forms the channel of the MOS transistor will soon contain a small countable number of dopant atoms. Because the placement of these dopant atoms is random ...
... behavior of a single MOSFET are well understood. For a refresher, we would recommend [75] and [5]. The book is organized in four major parts. The first part on Sources of Variability contains the three chapters of the book that deal ...
... behavior of the integrated circuit given that it is not possible to prototype the IC in order to find out whether and how well it works. The role of the design rules was to insure that the yield of the circuit - defined as the ...
... behavior of the transistor. We do not mean to imply that the scaling of these dimensions did not make transistor modeling more difficult, but rather to point out that the behavior of the transistor was determined by local geometry and ...
... behavior more difficult since it will be harder to define a canonical or typical device from which to perform device model characterization. We will come back to this subject later in Chapter 5. Secondly, it will make the circuit ...
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |