Design for Manufacturability and Statistical Design: A Constructive Approach

Pirmais vāks
Springer Science & Business Media, 2007. gada 28. okt. - 316 lappuses

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to

  • understanding the causes of variability;
  • design of test structures for variability characterization;
  • statistically rigorous data analysis;
  • techniques of design for manufacturability in lithography and in chemical mechanical polishing;
  • statistical simulation, analysis, and optimization techniques for improving parametric yield.

Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.

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Contents
1
BACK END VARIABILITY 43
42
ENVIRONMENTAL VARIABILITY
59
TEST STRUCTURES FOR VARIABILITY 85
84
STATISTICAL FOUNDATIONS OF DATA ANALYSIS
101
Design Techniques for Systematic Manufacturability
124
VARIABILITY
152
STATISTICAL CIRCUIT ANALYSIS 167
166
STATISTICAL STATIC TIMING ANALYSIS
201
LEAKAGE VARIABILITY AND JOINT PARAMETRIC
239
PARAMETRIC YIELD OPTIMIZATION
251
CONCLUSIONS 279
278
References
291
Index
309
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