Design for Manufacturability and Statistical Design: A Constructive ApproachSpringer Science & Business Media, 2007. gada 28. okt. - 316 lappuses Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to
Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. |
No grāmatas satura
1.–5. rezultāts no 13.
... (Leff), oxide thickness (Tox), threshold voltage (Vth), interconnect width (W) and height (H), and dielectric constant (ρ) [73]. These predictions should be interpreted cautiously, since the ability to control specific sources can change ...
... Leff tox V THW 30 40 50 10 H ρ 20 0 70 100 Technology Generation (nm) 130 180 250 Fig. 2.1. The 3σ parameter variation increases as a result of scaling (Reprinted from [73], c2000 IEEE). 2.2VARIABILITYOFGATELENGTH. 2.2.1 Gate Length ...
... Leff variability [20]. There are also multiple causes in the manufacturing sequence that contribute to overall Lgate variation. Table 2.2 provides a fairly exhaustive list of such causes, most of them are primarily interesting to ...
... Leff [29]. It is clear that below 45nm, line edge roughness does lead to the significantly increased mean leakage current. 2.2.5 Models of Lgate Spatial Correlation For the purpose of modeling of intra-chip variation of Lgate a model ...
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
Saturs
1 | |
BACK END VARIABILITY 43 | 42 |
ENVIRONMENTAL VARIABILITY | 59 |
TEST STRUCTURES FOR VARIABILITY 85 | 84 |
STATISTICAL FOUNDATIONS OF DATA ANALYSIS | 101 |
Design Techniques for Systematic Manufacturability | 124 |
VARIABILITY | 152 |
STATISTICAL CIRCUIT ANALYSIS 167 | 166 |
STATISTICAL STATIC TIMING ANALYSIS | 201 |
LEAKAGE VARIABILITY AND JOINT PARAMETRIC | 239 |
PARAMETRIC YIELD OPTIMIZATION | 251 |
CONCLUSIONS 279 | 278 |
References | 291 |
Index | 309 |
Citi izdevumi - Skatīt visu
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2007 |
Design for Manufacturability and Statistical Design: A Constructive Approach Michael Orshansky,Sani Nassif,Duane Boning Priekšskatījums nav pieejams - 2010 |