Reliability Verification, Testing, and Analysis in Engineering DesignCRC Press, 2002. gada 27. nov. - 416 lappuses Striking a balance between the use of computer-aided engineering practices and classical life testing, this reference expounds on current theory and methods for designing reliability tests and analyzing resultant data through various examples using Microsoft® Excel, MINITAB, WinSMITH, and ReliaSoft software across multiple industries. The book disc |
No grāmatas satura
1.–5. rezultāts no 41.
. lappuse
... Potential Flows : Computer Graphic Solutions , Robert H. Kirchhoff 38. Computer - Aided Graphics and Design : Second Edition , Daniel L. Ryan 39. Electronically Controlled Proportional Valves : Selection and Application , Michael J ...
... Potential Flows : Computer Graphic Solutions , Robert H. Kirchhoff 38. Computer - Aided Graphics and Design : Second Edition , Daniel L. Ryan 39. Electronically Controlled Proportional Valves : Selection and Application , Michael J ...
3. lappuse
... potential customer uses of a product up - front in the design processes . In some instances the hidden functions of a product may be perceived to be customer abuses or misuses of a product . As an example , consider the following two ...
... potential customer uses of a product up - front in the design processes . In some instances the hidden functions of a product may be perceived to be customer abuses or misuses of a product . As an example , consider the following two ...
9. lappuse
... potential for occurrence . In the appendix , Table 1-6 , a classification of failure modes according to their ... potentially critical ( important ) failure modes up front in the design process . Each failure mode is rated by its ...
... potential for occurrence . In the appendix , Table 1-6 , a classification of failure modes according to their ... potentially critical ( important ) failure modes up front in the design process . Each failure mode is rated by its ...
11. lappuse
... potential failure modes according to their severity and degree of loss of product function . organizations are using sound engineering design and design verification meth- ods . Accordingly , when we speak of design deficiencies , we ...
... potential failure modes according to their severity and degree of loss of product function . organizations are using sound engineering design and design verification meth- ods . Accordingly , when we speak of design deficiencies , we ...
12. lappuse
... potential variables are under exploration . Corrective action must eventually be taken at the product design , process design , or production stage to prevent failure recurrence . Customer misuse can occur when the product is used under ...
... potential variables are under exploration . Corrective action must eventually be taken at the product design , process design , or production stage to prevent failure recurrence . Customer misuse can occur when the product is used under ...
Saturs
LXXXVII | 204 |
LXXXVIII | 206 |
XC | 207 |
XCII | 208 |
XCIV | 210 |
XCVI | 211 |
XCVII | 213 |
XCVIII | 214 |
XI | 23 |
XII | 24 |
XIII | 25 |
XIV | 29 |
XV | 30 |
XVI | 32 |
XVIII | 35 |
XIX | 36 |
XX | 40 |
XXI | 63 |
XXII | 64 |
XXIV | 68 |
XXV | 71 |
XXVI | 74 |
XXVII | 75 |
XXVIII | 77 |
XXIX | 79 |
XXX | 81 |
XXXI | 83 |
XXXII | 84 |
XXXIII | 86 |
XXXIV | 88 |
XXXVI | 90 |
XXXVII | 92 |
XXXVIII | 95 |
XXXIX | 101 |
XLI | 104 |
XLIII | 105 |
XLIV | 110 |
XLV | 114 |
XLVI | 117 |
XLVIII | 118 |
L | 119 |
LI | 121 |
LII | 125 |
LIII | 126 |
LVI | 127 |
LVII | 129 |
LVIII | 131 |
LIX | 133 |
LX | 135 |
LXI | 137 |
LXIII | 142 |
LXIV | 147 |
LXV | 148 |
LXVI | 151 |
LXVII | 155 |
LXVIII | 157 |
LXIX | 159 |
LXX | 161 |
LXXI | 162 |
LXXII | 163 |
LXXIII | 164 |
LXXIV | 166 |
LXXV | 168 |
LXXVI | 173 |
LXXVII | 177 |
LXXVIII | 180 |
LXXIX | 186 |
LXXX | 189 |
LXXXI | 190 |
LXXXII | 195 |
LXXXIII | 196 |
LXXXIV | 199 |
LXXXV | 201 |
LXXXVI | 203 |
XCIX | 216 |
CI | 217 |
CII | 221 |
CIII | 222 |
CIV | 224 |
CVI | 225 |
CVIII | 226 |
CIX | 229 |
CX | 231 |
CXI | 233 |
CXII | 234 |
CXIII | 238 |
CXIV | 239 |
CXV | 240 |
CXVI | 241 |
CXVII | 246 |
CXVIII | 250 |
CXIX | 253 |
CXX | 254 |
CXXI | 255 |
CXXII | 257 |
CXXIII | 259 |
CXXIV | 260 |
CXXV | 265 |
CXXVII | 271 |
CXXVIII | 274 |
CXXX | 277 |
CXXXI | 280 |
CXXXII | 282 |
CXXXIV | 284 |
CXXXV | 287 |
CXXXVI | 289 |
CXXXVII | 290 |
CXXXVIII | 291 |
CXXXIX | 292 |
CXLI | 300 |
CXLIII | 305 |
CXLV | 307 |
CXLVI | 309 |
CXLVIII | 311 |
CXLIX | 312 |
CL | 314 |
CLI | 316 |
CLII | 319 |
CLIII | 320 |
CLIV | 322 |
CLVI | 325 |
CLVII | 329 |
CLVIII | 351 |
CLIX | 352 |
CLXI | 356 |
CLXIII | 359 |
CLXV | 360 |
CLXVI | 362 |
CLXVII | 367 |
CLXVIII | 368 |
CLXIX | 369 |
CLXX | 371 |
CLXXII | 372 |
CLXXIII | 373 |
CLXXIV | 376 |
CLXXVI | 377 |
CLXXVII | 379 |
CLXXVIII | 387 |
Citi izdevumi - Skatīt visu
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Ierobežota priekšskatīšana - 2002 |
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Priekšskatījums nav pieejams - 2002 |
Bieži izmantoti vārdi un frāzes
accelerated analysis Appendix approximation asymptotic beta distribution binomial distribution bogey testing Chapter component computer-aided engineering confidence intervals confidence limit cumulative cycles density function design verification electronics Equation evaluated exponential distribution expression F-distribution failure distribution failure mode Figure FMEA Goal Seek hazard identify illustrated inverse likelihood contours likelihood estimation linear location-scale distribution lognormal distribution lower confidence limit LR limits maximum likelihood median rank Microsoft Excel Minitab ML estimates Monte Carlo MTTF normal distribution occur parameter estimates percentile phenomena potential failure modes probability plots procedure properties Q-Q plots random variable rank estimator rank regression recorded failures relationship reliability metrics right-censored sample sizes shape parameter simulation standard normal stress subsystem success-failure test t₁ Table temperature usage values variance wearout Weibayes Weibull data Weibull distribution Weibull parameters Weibull plot Worked-out Example