Reliability Verification, Testing, and Analysis in Engineering DesignCRC Press, 2002. gada 27. nov. - 416 lappuses Striking a balance between the use of computer-aided engineering practices and classical life testing, this reference expounds on current theory and methods for designing reliability tests and analyzing resultant data through various examples using Microsoft® Excel, MINITAB, WinSMITH, and ReliaSoft software across multiple industries. The book disc |
No grāmatas satura
1.–5. rezultāts no 66.
13. lappuse
... expressions by any general power - law expression . AGREE : ad - hoc committee of DOD called " Advisory Group on the Reliability of Electronic Equipment . " Mil - STD - 781 " Reliability Qualification and Production Approval Tests ...
... expressions by any general power - law expression . AGREE : ad - hoc committee of DOD called " Advisory Group on the Reliability of Electronic Equipment . " Mil - STD - 781 " Reliability Qualification and Production Approval Tests ...
21. lappuse
... expressing a level of confidence that is associated with a lower confidence limit on reliability , R ( 3650 ) , as follows : PR ( 3650 ) ≥ 0.95 > 0.90 lower ( 1.7 ) confidence limit on R Guidelines for specifying reliability targets ...
... expressing a level of confidence that is associated with a lower confidence limit on reliability , R ( 3650 ) , as follows : PR ( 3650 ) ≥ 0.95 > 0.90 lower ( 1.7 ) confidence limit on R Guidelines for specifying reliability targets ...
66. lappuse
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
67. lappuse
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
71. lappuse
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
Esat sasniedzis šīs grāmatas aplūkošanas reižu limitu.
Saturs
LXXXVII | 204 |
LXXXVIII | 206 |
XC | 207 |
XCII | 208 |
XCIV | 210 |
XCVI | 211 |
XCVII | 213 |
XCVIII | 214 |
XI | 23 |
XII | 24 |
XIII | 25 |
XIV | 29 |
XV | 30 |
XVI | 32 |
XVIII | 35 |
XIX | 36 |
XX | 40 |
XXI | 63 |
XXII | 64 |
XXIV | 68 |
XXV | 71 |
XXVI | 74 |
XXVII | 75 |
XXVIII | 77 |
XXIX | 79 |
XXX | 81 |
XXXI | 83 |
XXXII | 84 |
XXXIII | 86 |
XXXIV | 88 |
XXXVI | 90 |
XXXVII | 92 |
XXXVIII | 95 |
XXXIX | 101 |
XLI | 104 |
XLIII | 105 |
XLIV | 110 |
XLV | 114 |
XLVI | 117 |
XLVIII | 118 |
L | 119 |
LI | 121 |
LII | 125 |
LIII | 126 |
LVI | 127 |
LVII | 129 |
LVIII | 131 |
LIX | 133 |
LX | 135 |
LXI | 137 |
LXIII | 142 |
LXIV | 147 |
LXV | 148 |
LXVI | 151 |
LXVII | 155 |
LXVIII | 157 |
LXIX | 159 |
LXX | 161 |
LXXI | 162 |
LXXII | 163 |
LXXIII | 164 |
LXXIV | 166 |
LXXV | 168 |
LXXVI | 173 |
LXXVII | 177 |
LXXVIII | 180 |
LXXIX | 186 |
LXXX | 189 |
LXXXI | 190 |
LXXXII | 195 |
LXXXIII | 196 |
LXXXIV | 199 |
LXXXV | 201 |
LXXXVI | 203 |
XCIX | 216 |
CI | 217 |
CII | 221 |
CIII | 222 |
CIV | 224 |
CVI | 225 |
CVIII | 226 |
CIX | 229 |
CX | 231 |
CXI | 233 |
CXII | 234 |
CXIII | 238 |
CXIV | 239 |
CXV | 240 |
CXVI | 241 |
CXVII | 246 |
CXVIII | 250 |
CXIX | 253 |
CXX | 254 |
CXXI | 255 |
CXXII | 257 |
CXXIII | 259 |
CXXIV | 260 |
CXXV | 265 |
CXXVII | 271 |
CXXVIII | 274 |
CXXX | 277 |
CXXXI | 280 |
CXXXII | 282 |
CXXXIV | 284 |
CXXXV | 287 |
CXXXVI | 289 |
CXXXVII | 290 |
CXXXVIII | 291 |
CXXXIX | 292 |
CXLI | 300 |
CXLIII | 305 |
CXLV | 307 |
CXLVI | 309 |
CXLVIII | 311 |
CXLIX | 312 |
CL | 314 |
CLI | 316 |
CLII | 319 |
CLIII | 320 |
CLIV | 322 |
CLVI | 325 |
CLVII | 329 |
CLVIII | 351 |
CLIX | 352 |
CLXI | 356 |
CLXIII | 359 |
CLXV | 360 |
CLXVI | 362 |
CLXVII | 367 |
CLXVIII | 368 |
CLXIX | 369 |
CLXX | 371 |
CLXXII | 372 |
CLXXIII | 373 |
CLXXIV | 376 |
CLXXVI | 377 |
CLXXVII | 379 |
CLXXVIII | 387 |
Citi izdevumi - Skatīt visu
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Ierobežota priekšskatīšana - 2002 |
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Priekšskatījums nav pieejams - 2002 |
Bieži izmantoti vārdi un frāzes
accelerated analysis Appendix approximation asymptotic beta distribution binomial distribution bogey testing Chapter component computer-aided engineering confidence intervals confidence limit cumulative cycles density function design verification electronics Equation evaluated exponential distribution expression F-distribution failure distribution failure mode Figure FMEA Goal Seek hazard identify illustrated inverse likelihood contours likelihood estimation linear location-scale distribution lognormal distribution lower confidence limit LR limits maximum likelihood median rank Microsoft Excel Minitab ML estimates Monte Carlo MTTF normal distribution occur parameter estimates percentile phenomena potential failure modes probability plots procedure properties Q-Q plots random variable rank estimator rank regression recorded failures relationship reliability metrics right-censored sample sizes shape parameter simulation standard normal stress subsystem success-failure test t₁ Table temperature usage values variance wearout Weibayes Weibull data Weibull distribution Weibull parameters Weibull plot Worked-out Example