Reliability Verification, Testing, and Analysis in Engineering DesignCRC Press, 2002. gada 27. nov. - 416 lappuses Striking a balance between the use of computer-aided engineering practices and classical life testing, this reference expounds on current theory and methods for designing reliability tests and analyzing resultant data through various examples using Microsoft® Excel, MINITAB, WinSMITH, and ReliaSoft software across multiple industries. The book disc |
No grāmatas satura
1.–5. rezultāts no 33.
3. lappuse
... caused by product malfunction or safety concerns . Some corporations are even beginning to adopt alternate terminology such as " performance - challenged " or " impaired function " in order to avoid any usage of words such as " failure ...
... caused by product malfunction or safety concerns . Some corporations are even beginning to adopt alternate terminology such as " performance - challenged " or " impaired function " in order to avoid any usage of words such as " failure ...
5. lappuse
... cause cracking , and other changes to surface geometry and material properties over time . Manufacturing variation in raw - material composition and geometry , process settings , and process performance . Residual stress concentrations ...
... cause cracking , and other changes to surface geometry and material properties over time . Manufacturing variation in raw - material composition and geometry , process settings , and process performance . Residual stress concentrations ...
6. lappuse
... caused by a deficiency in the product or process design that was not identified prior to the product's release to the customer . In such cases design errors might result in the product's never performing to customer expectations , or it ...
... caused by a deficiency in the product or process design that was not identified prior to the product's release to the customer . In such cases design errors might result in the product's never performing to customer expectations , or it ...
10. lappuse
... causing problems with performance when product is used in the field . Product is damaged during handling and / or distribution . 3. Misuse Product is misused by customer or perhaps during service . In the preceding list we make a ...
... causing problems with performance when product is used in the field . Product is damaged during handling and / or distribution . 3. Misuse Product is misused by customer or perhaps during service . In the preceding list we make a ...
12. lappuse
... causes due to abnormalities in the grade of materials , assembly , and human errors , etc. They are an important concern to reliability professionals , particularly in electronics , as the majority of reliability problems in electronics ...
... causes due to abnormalities in the grade of materials , assembly , and human errors , etc. They are an important concern to reliability professionals , particularly in electronics , as the majority of reliability problems in electronics ...
Saturs
LXXXVII | 204 |
LXXXVIII | 206 |
XC | 207 |
XCII | 208 |
XCIV | 210 |
XCVI | 211 |
XCVII | 213 |
XCVIII | 214 |
XI | 23 |
XII | 24 |
XIII | 25 |
XIV | 29 |
XV | 30 |
XVI | 32 |
XVIII | 35 |
XIX | 36 |
XX | 40 |
XXI | 63 |
XXII | 64 |
XXIV | 68 |
XXV | 71 |
XXVI | 74 |
XXVII | 75 |
XXVIII | 77 |
XXIX | 79 |
XXX | 81 |
XXXI | 83 |
XXXII | 84 |
XXXIII | 86 |
XXXIV | 88 |
XXXVI | 90 |
XXXVII | 92 |
XXXVIII | 95 |
XXXIX | 101 |
XLI | 104 |
XLIII | 105 |
XLIV | 110 |
XLV | 114 |
XLVI | 117 |
XLVIII | 118 |
L | 119 |
LI | 121 |
LII | 125 |
LIII | 126 |
LVI | 127 |
LVII | 129 |
LVIII | 131 |
LIX | 133 |
LX | 135 |
LXI | 137 |
LXIII | 142 |
LXIV | 147 |
LXV | 148 |
LXVI | 151 |
LXVII | 155 |
LXVIII | 157 |
LXIX | 159 |
LXX | 161 |
LXXI | 162 |
LXXII | 163 |
LXXIII | 164 |
LXXIV | 166 |
LXXV | 168 |
LXXVI | 173 |
LXXVII | 177 |
LXXVIII | 180 |
LXXIX | 186 |
LXXX | 189 |
LXXXI | 190 |
LXXXII | 195 |
LXXXIII | 196 |
LXXXIV | 199 |
LXXXV | 201 |
LXXXVI | 203 |
XCIX | 216 |
CI | 217 |
CII | 221 |
CIII | 222 |
CIV | 224 |
CVI | 225 |
CVIII | 226 |
CIX | 229 |
CX | 231 |
CXI | 233 |
CXII | 234 |
CXIII | 238 |
CXIV | 239 |
CXV | 240 |
CXVI | 241 |
CXVII | 246 |
CXVIII | 250 |
CXIX | 253 |
CXX | 254 |
CXXI | 255 |
CXXII | 257 |
CXXIII | 259 |
CXXIV | 260 |
CXXV | 265 |
CXXVII | 271 |
CXXVIII | 274 |
CXXX | 277 |
CXXXI | 280 |
CXXXII | 282 |
CXXXIV | 284 |
CXXXV | 287 |
CXXXVI | 289 |
CXXXVII | 290 |
CXXXVIII | 291 |
CXXXIX | 292 |
CXLI | 300 |
CXLIII | 305 |
CXLV | 307 |
CXLVI | 309 |
CXLVIII | 311 |
CXLIX | 312 |
CL | 314 |
CLI | 316 |
CLII | 319 |
CLIII | 320 |
CLIV | 322 |
CLVI | 325 |
CLVII | 329 |
CLVIII | 351 |
CLIX | 352 |
CLXI | 356 |
CLXIII | 359 |
CLXV | 360 |
CLXVI | 362 |
CLXVII | 367 |
CLXVIII | 368 |
CLXIX | 369 |
CLXX | 371 |
CLXXII | 372 |
CLXXIII | 373 |
CLXXIV | 376 |
CLXXVI | 377 |
CLXXVII | 379 |
CLXXVIII | 387 |
Citi izdevumi - Skatīt visu
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Ierobežota priekšskatīšana - 2002 |
Reliability Verification, Testing, and Analysis in Engineering Design Gary Wasserman Priekšskatījums nav pieejams - 2002 |
Bieži izmantoti vārdi un frāzes
accelerated analysis Appendix approximation asymptotic beta distribution binomial distribution bogey testing Chapter component computer-aided engineering confidence intervals confidence limit cumulative cycles density function design verification electronics Equation evaluated exponential distribution expression F-distribution failure distribution failure mode Figure FMEA Goal Seek hazard identify illustrated inverse likelihood contours likelihood estimation linear location-scale distribution lognormal distribution lower confidence limit LR limits maximum likelihood median rank Microsoft Excel Minitab ML estimates Monte Carlo MTTF normal distribution occur parameter estimates percentile phenomena potential failure modes probability plots procedure properties Q-Q plots random variable rank estimator rank regression recorded failures relationship reliability metrics right-censored sample sizes shape parameter simulation standard normal stress subsystem success-failure test t₁ Table temperature usage values variance wearout Weibayes Weibull data Weibull distribution Weibull parameters Weibull plot Worked-out Example