Leakage in Nanometer CMOS TechnologiesSiva G. Narendra, Anantha P. Chandrakasan Springer Science & Business Media, 2006. gada 10. marts - 308 lappuses Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumption, and in many scaled technologies leakage contributes 30-50% of the overall power consumption under nominal operating conditions. Leakage is important in a variety of different contexts. For example, in desktop applications, active leakage power (i.e., leakage power when the processor is computing) is becoming significant compared to switching power. In battery operated systems, standby leakage (i.e., leakage when the processor clock is turned off) dominates as energy is drawn over long idle periods. Increased transistor leakages not only impact the overall power consumed by a CMOS system, but also reduce the margins available for design due to the strong relationship between process variation and leakage power. It is essential for circuit and system designers to understand the components of leakage, sensitivity of leakage to different design parameters, and leakage mitigation techniques in nanometer technologies. This book provides an in-depth treatment of these issues for researchers and product designers. |
No grāmatas satura
1.–5. rezultāts no 81.
vii. lappuse
... Leakage Reduction in SRAM module References Case Study: Leakage Reduction in the Intel Xscale Microprocessor 201 202 208 209 211 212 214 216 218 227 229 232 232 235 240 249 255 References 279 12. Transistor Design to Reduce Leakage ...
... Leakage Reduction in SRAM module References Case Study: Leakage Reduction in the Intel Xscale Microprocessor 201 202 208 209 211 212 214 216 218 227 229 232 232 235 240 249 255 References 279 12. Transistor Design to Reduce Leakage ...
2. lappuse
... leakage will also be introduced. Prediction Reduction Adaptation Administration. |. Sources <--> Transistor & Environment Figure 1-1. Taxonomy of leakage – sources, its impact, and solutions to reduce the impact. Sources originate at the ...
... leakage will also be introduced. Prediction Reduction Adaptation Administration. |. Sources <--> Transistor & Environment Figure 1-1. Taxonomy of leakage – sources, its impact, and solutions to reduce the impact. Sources originate at the ...
3. lappuse
Siva G. Narendra, Anantha P. Chandrakasan. reduce the impact leakage will have on the design margin. Techniques such as adaptive body bias and adaptive supply voltage will be discussed in detail in latter chapters. Impact of process ...
Siva G. Narendra, Anantha P. Chandrakasan. reduce the impact leakage will have on the design margin. Techniques such as adaptive body bias and adaptive supply voltage will be discussed in detail in latter chapters. Impact of process ...
7. lappuse
... reduction from 1 nm in silicon to 0.3 nm in oxide is due to difference between the dielectric constants of silicon ... leakage. Identification of a proper high permittivity dielectric material that has good interface states with silicon along ...
... reduction from 1 nm in silicon to 0.3 nm in oxide is due to difference between the dielectric constants of silicon ... leakage. Identification of a proper high permittivity dielectric material that has good interface states with silicon along ...
9. lappuse
... reduced the barrier for the majority carriers to enter the channel also is reduced as indicated in the figure. This results in reduced threshold voltage. In other words, anytime the depletion charge between the source-body and drain ...
... reduced the barrier for the majority carriers to enter the channel also is reduced as indicated in the figure. This results in reduced threshold voltage. In other words, anytime the depletion charge between the source-body and drain ...
Saturs
Chapter 6 | 141 |
Chapter 7 | 163 |
Chapter 8 | 200 |
L | 209 |
Chapter 9 | 211 |
Chapter 10 | 234 |
VVV0xW+2+ 20 1 | 236 |
Periphery | 254 |
Chapter 4 | 77 |
11 | 81 |
Vdd I t I | 96 |
botas bbarabosse cseldk14keyb long sandsly | 102 |
Chapter 5 | 105 |
6 | 108 |
aget | 121 |
Chapter 11 | 257 |
i | 269 |
i | 274 |
Chapter 12 | 281 |
B | 291 |
Figure 129 Carbon nanotube structures | 298 |
Citi izdevumi - Skatīt visu
Leakage in Nanometer CMOS Technologies Siva G. Narendra,Anantha P. Chandrakasan Priekšskatījums nav pieejams - 2005 |
Leakage in Nanometer CMOS Technologies Siva G. Narendra,Anantha P. Chandrakasan Priekšskatījums nav pieejams - 2010 |
Bieži izmantoti vārdi un frāzes
achieved active mode adaptive additional allows applied approach becomes biasing block body bias capacitance cause cell channel length Chapter charge chip circuit clock CMOS compared critical defective delay depends described devices drain drive dynamic effect energy example Figure frequency higher IDDQ IEEE impact implementation improve increase input junction larger leakage current leakage power leakage reduction limit logic lower measured microprocessor minimize MOSFET MTCMOS needed NMOS node noise operation output oxide parameter path penalty performance PMOS power gating power supply power switch presented reduce leakage reduced savings scaling scheme selected shown in Figure shows signal sleep transistor smaller solution speed SRAM stack standby mode sub-threshold leakage substrate supply voltage techniques temperature threshold voltage tunneling turned variation virtual width
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Atsauces uz šo grāmatu
Low Power Methodology Manual: For System-on-Chip Design David Flynn,Rob Aitken,Alan Gibbons,Kaijian Shi Ierobežota priekšskatīšana - 2007 |
Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication Hubert Kaeslin Ierobežota priekšskatīšana - 2008 |