Laser Induced Damage in Optical Materials: Proceedings of a Symposium Sponsored by the American Society for Testing and Materials and by the National Bureau of StandardsU.S. Department of Commerce, National Bureau of Standards, 1989 |
No grāmatas satura
1.–5. rezultāts no 52.
viii. lappuse
... Scanning Tunneling Microscopy Study of the Effects of Pulsed High Power Laser Irradiation on Carbon , Silicon Carbide , and Gold Surfaces Wigbert Siekhaus , Thomas Beebe , and Markus Schildbach Tarnishing Measurements of A120 ...
... Scanning Tunneling Microscopy Study of the Effects of Pulsed High Power Laser Irradiation on Carbon , Silicon Carbide , and Gold Surfaces Wigbert Siekhaus , Thomas Beebe , and Markus Schildbach Tarnishing Measurements of A120 ...
15. lappuse
... scanning slit technique . The focal spot size is then calculated using diffraction limited Gaussian optics . The temporal profile is measured by a zero background second harmonic generation autocorrelation procedure . The spot size is ...
... scanning slit technique . The focal spot size is then calculated using diffraction limited Gaussian optics . The temporal profile is measured by a zero background second harmonic generation autocorrelation procedure . The spot size is ...
34. lappuse
... the source laser beam to the test cavity . Another commonly used technique for measurement of losses of a mirror is to construct a scanning Fabry Perot 34 Optical Measurements at PMS Electro-Optics Ramin Lalezari and Scott Knollenberg.
... the source laser beam to the test cavity . Another commonly used technique for measurement of losses of a mirror is to construct a scanning Fabry Perot 34 Optical Measurements at PMS Electro-Optics Ramin Lalezari and Scott Knollenberg.
35. lappuse
... scanning Fabry Perot interferometer from the mirrors and measure its finesse and throughput . This technique is also very sensitive to the mode matching of the source beam to the cavity and to the mechanical stability of the cavity ...
... scanning Fabry Perot interferometer from the mirrors and measure its finesse and throughput . This technique is also very sensitive to the mode matching of the source beam to the cavity and to the mechanical stability of the cavity ...
45. lappuse
... scan , power monitor ratio Data format : Raw data , calculated data ( BRDF in B - Bo , log - log format ) , digital files ( ASCII format ) Surface model extrapolations : Power spectrum , total scatter , surface roughness , linear shift ...
... scan , power monitor ratio Data format : Raw data , calculated data ( BRDF in B - Bo , log - log format ) , digital files ( ASCII format ) Surface model extrapolations : Power spectrum , total scatter , surface roughness , linear shift ...
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Citi izdevumi - Skatīt visu
Bieži izmantoti vārdi un frāzes
absorption Alamos approximately avalanche BaF2 band gap BDH sample Boulder Damage Symposium BRDF CaF2 calculated cerium chamfers coefficient crystal curve Damage in Optical damage testing damage threshold defects density dependence deposited detector diameter dielectric dye laser effect electron avalanche emission excimer excimer laser experimental F-center fluence fluoride fused silica glass Guenther heating imaging impurities incident increase intensity interface ionization irradiation J/cm² laser beam laser damage threshold Laser Induced Damage laser irradiation laser pulse laser-induced layer lens Livermore measured MgF2 mirror MOSFETs multiphoton Nd:YAG nonlinear observed optical coatings Optical Materials P.O. Box parameters particles peak photodiodes photon Phys polished poly-silicon pulse energy radiation reflectance reflectivity loss reflectors refractive index scan scatter shot shown in figure shows SiO2 slab spectra sputtering stress structure substrate surface technique temperature thickness thin films TiO2 transient values wavelength
Populāri fragmenti
iv. lappuse - Certain commercial equipment, instruments, or materials are identified in this paper in order to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
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