Laser Induced Damage in Optical Materials: Proceedings of a Symposium Sponsored by the American Society for Testing and Materials and by the National Bureau of StandardsU.S. Department of Commerce, National Bureau of Standards, 1989 |
No grāmatas satura
1.–5. rezultāts no 41.
. lappuse
... Electrical • Engineering2 Manufacturing Engineering • Building Technology • Fire Research • Chemical Engineering3 • Information Systems Engineering • Systems and Software Technology • • Computer Security Systems and Network Architecture ...
... Electrical • Engineering2 Manufacturing Engineering • Building Technology • Fire Research • Chemical Engineering3 • Information Systems Engineering • Systems and Software Technology • • Computer Security Systems and Network Architecture ...
vi. lappuse
... Electrical Performance of Silicon MOS Device Structures .... Chen - Zhi Zhang , Steve E. Watkins , Rodger M. Walser , and Michael F. Becker A Multi - Facet XUV Aluminium Mirror for the FEL Marion L. Scott Measurement of the Three Photon ...
... Electrical Performance of Silicon MOS Device Structures .... Chen - Zhi Zhang , Steve E. Watkins , Rodger M. Walser , and Michael F. Becker A Multi - Facet XUV Aluminium Mirror for the FEL Marion L. Scott Measurement of the Three Photon ...
ix. lappuse
... Electrical Parameter Degradation in Silicon Photodiodes Steve E. Watkins , Chen - Zhi Zhang , Rodger M. Walser , and Michael F. Becker Stress Reduction of Ion - Beam - Sputtered Mixed - Oxide Coatings by Baking B. J. Pond , J. I. DeBar ...
... Electrical Parameter Degradation in Silicon Photodiodes Steve E. Watkins , Chen - Zhi Zhang , Rodger M. Walser , and Michael F. Becker Stress Reduction of Ion - Beam - Sputtered Mixed - Oxide Coatings by Baking B. J. Pond , J. I. DeBar ...
xxxiii. lappuse
... Electric Fields near Coated Surfaces : Application to Damage Protection H. B. Rosenstock .... BREAKDOWN PHENOMENA Computer Simulation of Laser Damage Morphology in the Alkali Halides P. Kelly , D. Ritchie , P. Braunlich , and A. Schmid ...
... Electric Fields near Coated Surfaces : Application to Damage Protection H. B. Rosenstock .... BREAKDOWN PHENOMENA Computer Simulation of Laser Damage Morphology in the Alkali Halides P. Kelly , D. Ritchie , P. Braunlich , and A. Schmid ...
77. lappuse
... electrical conduc- tivity , which may vary from film to film due to differences in film quality . The extinction coefficient in the high - temperature regime is found to increase with increasing wavelength , as expected . The product n ...
... electrical conduc- tivity , which may vary from film to film due to differences in film quality . The extinction coefficient in the high - temperature regime is found to increase with increasing wavelength , as expected . The product n ...
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Citi izdevumi - Skatīt visu
Bieži izmantoti vārdi un frāzes
absorption Alamos approximately avalanche BaF2 band gap BDH sample Boulder Damage Symposium BRDF CaF2 calculated cerium chamfers coefficient crystal curve Damage in Optical damage testing damage threshold defects density dependence deposited detector diameter dielectric dye laser effect electron avalanche emission excimer excimer laser experimental F-center fluence fluoride fused silica glass Guenther heating imaging impurities incident increase intensity interface ionization irradiation J/cm² laser beam laser damage threshold Laser Induced Damage laser irradiation laser pulse laser-induced layer lens Livermore measured MgF2 mirror MOSFETs multiphoton Nd:YAG nonlinear observed optical coatings Optical Materials P.O. Box parameters particles peak photodiodes photon Phys polished poly-silicon pulse energy radiation reflectance reflectivity loss reflectors refractive index scan scatter shot shown in figure shows SiO2 slab spectra sputtering stress structure substrate surface technique temperature thickness thin films TiO2 transient values wavelength
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