Laser Induced Damage in Optical Materials: Proceedings of a Symposium Sponsored by the American Society for Testing and Materials and by the National Bureau of StandardsU.S. Department of Commerce, National Bureau of Standards, 1989 |
No grāmatas satura
1.–5. rezultāts no 100.
. lappuse
... Laser Induced Damage in Optical Materials : 1988 BOULDER DAMAGE SYMPOSIUM THE UNIVERSITY OF MICHIGAN ENGINEERING LIBRARY The University of Michigan Media Union Library ASTM STP 1099 T he National Institute of Standards and Technology ...
... Laser Induced Damage in Optical Materials : 1988 BOULDER DAMAGE SYMPOSIUM THE UNIVERSITY OF MICHIGAN ENGINEERING LIBRARY The University of Michigan Media Union Library ASTM STP 1099 T he National Institute of Standards and Technology ...
. lappuse
... Technology › Computer Security Systems and Network Architecture • Advanced Systems • Ceramics • Fracture and Deformation3 • Polymers • Metallurgy • Reactor Radiation Laser Induced Damage in Optical Materials : 1988 Proceedings of.
... Technology › Computer Security Systems and Network Architecture • Advanced Systems • Ceramics • Fracture and Deformation3 • Polymers • Metallurgy • Reactor Radiation Laser Induced Damage in Optical Materials : 1988 Proceedings of.
i. lappuse
... Laser Induced Damage in Optical Materials : 1988 Proceedings of a Symposium sponsored by : National Institute of Standards and Technology ( formerly National Bureau of Standards ) American Society for Testing and Materials Defense ...
... Laser Induced Damage in Optical Materials : 1988 Proceedings of a Symposium sponsored by : National Institute of Standards and Technology ( formerly National Bureau of Standards ) American Society for Testing and Materials Defense ...
vi. lappuse
... Laser Damage S. E. Clark and D. C. Emmony Repetitively Pulsed Beam Diagnostics for Large Laser Optics Damage D. B. ... Induced Changes in the Electrical Performance of Silicon MOS Device Structures 105 Chen - Zhi Zhang , Steve E. Watkins ...
... Laser Damage S. E. Clark and D. C. Emmony Repetitively Pulsed Beam Diagnostics for Large Laser Optics Damage D. B. ... Induced Changes in the Electrical Performance of Silicon MOS Device Structures 105 Chen - Zhi Zhang , Steve E. Watkins ...
vii. lappuse
... Laser - Induced Surface Ablation and Optical Damage of ZnS Crystals Caused by Single - and Multiple - Pulse Laser Irradiation H. F. Arlinghaus , W. F. Calaway , D. M. Gruen , and L. L. Chase Substrate Cleaning in Vacuum by Laser ...
... Laser - Induced Surface Ablation and Optical Damage of ZnS Crystals Caused by Single - and Multiple - Pulse Laser Irradiation H. F. Arlinghaus , W. F. Calaway , D. M. Gruen , and L. L. Chase Substrate Cleaning in Vacuum by Laser ...
Saturs
xiii | |
xix | |
xxxiv | |
12 | |
22 | |
34 | |
42 | |
48 | |
232 | |
245 | |
259 | |
265 | |
273 | |
286 | |
287 | |
311 | |
61 | |
74 | |
87 | |
105 | |
118 | |
122 | |
128 | |
140 | |
152 | |
166 | |
175 | |
183 | |
189 | |
211 | |
212 | |
328 | |
348 | |
361 | |
377 | |
385 | |
398 | |
414 | |
427 | |
440 | |
455 | |
462 | |
470 | |
502 | |
516 | |
Citi izdevumi - Skatīt visu
Bieži izmantoti vārdi un frāzes
absorbing inclusions absorption Alamos approximately BaF2 birefringence Boulder Damage Symposium BRDF CaF2 cavity cerium chamber coefficient crystal curve Damage in Optical damage testing damage threshold defects density dependence deposited detector diameter dielectric dye laser effect electron avalanche emission excimer excimer laser experimental F-center fluence free electron fused silica glass Guenther heating impurities incident increase intensity interface ionization irradiation J/cm² Laboratory laser beam laser damage threshold Laser Induced Damage laser irradiation laser pulse Livermore measured MgF2 mirror morphology multiphoton Nd:YAG nonlinear observed optical coatings Optical Materials P.O. Box parameters particle peak photodiodes photon Phys polished pulse width pump radiation reflectance reflectivity loss reflectors refractive index sample scan scatter shots shown in figure shows SiO2 slab spectra sputtering stress structure substrate surface technique temperature thermal explosion thickness thin films TiO2 transient values wavelength zirconia
Populāri fragmenti
iv. lappuse - Certain commercial equipment, instruments, or materials are identified in this paper in order to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
334. lappuse - Laboratory is operated by Battelle Memorial Institute for the US Department of Energy under contract DE-AC0676RLO 1830.