Laser Induced Damage in Optical Materials: Proceedings of a Symposium Sponsored by the American Society for Testing and Materials and by the National Bureau of StandardsU.S. Department of Commerce, National Bureau of Standards, 1989 |
No grāmatas satura
1.–5. rezultāts no 65.
106. lappuse
... J / cm2 , and then decreased significantly at about 0.4 J / cm2 . All of these changes occurred below the visible damage onset fluence at around 1.0 J / cm2 . This decrease may be due to grain growth by fast laser heating or due to the ...
... J / cm2 , and then decreased significantly at about 0.4 J / cm2 . All of these changes occurred below the visible damage onset fluence at around 1.0 J / cm2 . This decrease may be due to grain growth by fast laser heating or due to the ...
107. lappuse
... J / cm2 as shown in figure 6 ( b ) . This leakage appeared to be insensitive to the gate width or length as all ... cm2 to 1.1 J.cm2 , morphological damage appeared in the form of color change ( thickness change ) , gate edge erosion or ...
... J / cm2 as shown in figure 6 ( b ) . This leakage appeared to be insensitive to the gate width or length as all ... cm2 to 1.1 J.cm2 , morphological damage appeared in the form of color change ( thickness change ) , gate edge erosion or ...
108. lappuse
... J / cm2 " Material Color change ( height change ) Melting or shrinkage Breaking Poly - Si 1 0.7 ( 0.5 ) 0.9 ( 0.6 ) 1.1 ( 0.7 ) Poly - Si 2 N.A. 1.1 ( 0.9 ) 1.3 ( 1.2 ) Aluminum N.A. 0.9 ( 0.6 ) 1.0 ( 0.8 ) * These are obtained from the ...
... J / cm2 " Material Color change ( height change ) Melting or shrinkage Breaking Poly - Si 1 0.7 ( 0.5 ) 0.9 ( 0.6 ) 1.1 ( 0.7 ) Poly - Si 2 N.A. 1.1 ( 0.9 ) 1.3 ( 1.2 ) Aluminum N.A. 0.9 ( 0.6 ) 1.0 ( 0.8 ) * These are obtained from the ...
109. lappuse
... J / cm2 , where W / L = 36/36 ... 3 micron ( top row ) , and W / L = 54 ... 3/6 micron . Sample holder ( x - y stage ) He - Ne laser Lens ( 76 cm f.l. ) Fixed and adjustable attenuators Shutter EM 1 x - y step signal EM 2 Nd : YAG 10ns ...
... J / cm2 , where W / L = 36/36 ... 3 micron ( top row ) , and W / L = 54 ... 3/6 micron . Sample holder ( x - y stage ) He - Ne laser Lens ( 76 cm f.l. ) Fixed and adjustable attenuators Shutter EM 1 x - y step signal EM 2 Nd : YAG 10ns ...
110. lappuse
... cm2 and 1.1 J / cm2 , respectively ; ( c ) and ( d ) for Poly - Si 2 : 1.6 J / cm2 ( 500x ) and 1.7 J / cm2 ( 60x ) , respectively ; ( e ) and ( f ) for Al - Polymer layers : 1.0 J / cm2 ( 240x ) and 1.3 J / cm2 ( 120x ) respectively ...
... cm2 and 1.1 J / cm2 , respectively ; ( c ) and ( d ) for Poly - Si 2 : 1.6 J / cm2 ( 500x ) and 1.7 J / cm2 ( 60x ) , respectively ; ( e ) and ( f ) for Al - Polymer layers : 1.0 J / cm2 ( 240x ) and 1.3 J / cm2 ( 120x ) respectively ...
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Citi izdevumi - Skatīt visu
Bieži izmantoti vārdi un frāzes
absorbing inclusions absorption Alamos approximately BaF2 birefringence Boulder Damage Symposium BRDF CaF2 cavity cerium chamber coefficient crystal curve Damage in Optical damage testing damage threshold defects density dependence deposited detector diameter dielectric dye laser effect electron avalanche emission excimer excimer laser experimental F-center fluence free electron fused silica glass Guenther heating impurities incident increase intensity interface ionization irradiation J/cm² Laboratory laser beam laser damage threshold Laser Induced Damage laser irradiation laser pulse Livermore measured MgF2 mirror morphology multiphoton Nd:YAG nonlinear observed optical coatings Optical Materials P.O. Box parameters particle peak photodiodes photon Phys polished pulse width pump radiation reflectance reflectivity loss reflectors refractive index sample scan scatter shots shown in figure shows SiO2 slab spectra sputtering stress structure substrate surface technique temperature thermal explosion thickness thin films TiO2 transient values wavelength zirconia
Populāri fragmenti
iv. lappuse - Certain commercial equipment, instruments, or materials are identified in this paper in order to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
334. lappuse - Laboratory is operated by Battelle Memorial Institute for the US Department of Energy under contract DE-AC0676RLO 1830.