Laser Induced Damage in Optical Materials: Proceedings of a Symposium Sponsored by the American Society for Testing and Materials and by the National Bureau of StandardsU.S. Department of Commerce, National Bureau of Standards, 1986 |
No grāmatas satura
1.–5. rezultāts no 100.
. lappuse
... measurement system , ( 2 ) scientific and technological services for industry and government , ( 3 ) a technical ... Measurement Laboratory , the National Engineering Laboratory , the Institute for Computer Sciences and Technology , and ...
... measurement system , ( 2 ) scientific and technological services for industry and government , ( 3 ) a technical ... Measurement Laboratory , the National Engineering Laboratory , the Institute for Computer Sciences and Technology , and ...
3. lappuse
... measured in other unpublished tests at 248 nm . ) Possible explanations have been suggested , but these results are ... Measurements , ( 2 ) Mirrors and Surfaces , ( 3 ) Thin Films , and ( 4 ) Fundamental Mechanisms . These conference ...
... measured in other unpublished tests at 248 nm . ) Possible explanations have been suggested , but these results are ... Measurements , ( 2 ) Mirrors and Surfaces , ( 3 ) Thin Films , and ( 4 ) Fundamental Mechanisms . These conference ...
5. lappuse
... measurements by several operators indicated that the precision in reflectance measurements was ± 0.0007 . The authors reported 351 - nm reflec- tances ranging from 0.8498 to 0.9976 that were measured on 17 multiple - layer HR coatings ...
... measurements by several operators indicated that the precision in reflectance measurements was ± 0.0007 . The authors reported 351 - nm reflec- tances ranging from 0.8498 to 0.9976 that were measured on 17 multiple - layer HR coatings ...
8. lappuse
... measured at the three pulse durations were 11 , 26.5 , and 38 J / cm2 , respectively . The observed threshold scaling to the 0.56 power of the pulsewidth is , within experimental error , close to the 0.5 power previously measured for ...
... measured at the three pulse durations were 11 , 26.5 , and 38 J / cm2 , respectively . The observed threshold scaling to the 0.56 power of the pulsewidth is , within experimental error , close to the 0.5 power previously measured for ...
9. lappuse
... measurements of the thermal properties of optical material in thin film form and compared them to tabulated bulk mate- rial properties . Materials initially analyzed were the important refractory oxides A1203 and Si02 . Measured values ...
... measurements of the thermal properties of optical material in thin film form and compared them to tabulated bulk mate- rial properties . Materials initially analyzed were the important refractory oxides A1203 and Si02 . Measured values ...
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Citi izdevumi - Skatīt visu
Bieži izmantoti vārdi un frāzes
absorption anatase angle of incidence antireflection coatings Appl attenuator band gap breakdown bulk coefficient Damage in Optical damage morphology damage resistance damage sites damage testing damage threshold defects density deposition detector diameter dielectric effect electric field electron beam energy experimental fluence fused silica Guenther heat High Power Lasers increase indicated intensity interface ion beam J/cm² Laboratory laser beam Laser Induced Damage laser pulses layer liquid crystal magnesium fluoride measured microscopy mirror multilayer Nd:YAG Newnam Nomarski nonlinear observed obtained optical coatings Optical Materials overcoat oxide oxygen peak phase Phys polarization probe produced pulsed laser radiation Raman reflectance reflectors refractive index ripple rutile S-polarized sample scanning scatter self-focusing shown in figure silicon spatial spectra sputter deposited sputtering stack stoichiometry structure substrate surface potential Symposium technique temperature thermal thickness thin film transmission transmittance two-photon absorption values wavelength ZnSe ZrO2
Populāri fragmenti
285. lappuse - This work performed under the auspices of the US Department of Energy by Lawrence Livermore National Laboratory under contract No.
382. lappuse - The United States Government is authorized to reproduce and distribute reprints for Government purposes notwithstanding any copyright notation hereon.
iii. lappuse - Certain commercial equipment, instruments or materials are identified in this paper in order to adequately specify the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Bureau of Standards, nor does it imply that the material or equipment identified is necessarily the best available for the purpose.